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A Simple Evaluation Procedure of the Tan Calibration and the Influence of Non-ideal Calibration Elements on Vna S-parameter Measurements : Volume 5, Issue 2 (12/06/2007)

By Stumper, U.

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Book Id: WPLBN0003972876
Format Type: PDF Article :
File Size: Pages 8
Reproduction Date: 2015

Title: A Simple Evaluation Procedure of the Tan Calibration and the Influence of Non-ideal Calibration Elements on Vna S-parameter Measurements : Volume 5, Issue 2 (12/06/2007)  
Author: Stumper, U.
Volume: Vol. 5, Issue 2
Language: English
Subject: Science, Advances, Radio
Collections: Periodicals: Journal and Magazine Collection (Contemporary), Copernicus GmbH
Historic
Publication Date:
2007
Publisher: Copernicus Gmbh, Göttingen, Germany
Member Page: Copernicus Publications

Citation

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Stumper, U. (2007). A Simple Evaluation Procedure of the Tan Calibration and the Influence of Non-ideal Calibration Elements on Vna S-parameter Measurements : Volume 5, Issue 2 (12/06/2007). Retrieved from http://www.ebooklibrary.org/


Description
Description: Physikalisch-Technische Bundesanstalt, Bundesallee 100, 38116 Braunschweig, Germany. For the 7-term general TAN (Through-Attenuator-Network) self-calibration method of a four-sampler vector network analyser (VNA), and for all derived calibration methods like TLN, TRL, TRM, TAR, or TMN, it is shown that a very simple evaluation procedure of the seven error terms is possible, even if the Through connection is replaced by a reflectionless network with known transmission. Expressions for the deviations of the measured S-parameters of two-port test objects (d.u.t.s) from the true values, which are caused by deviations of the modeled S-parameters of non-ideal calibration elements (standards) from their true values, are also presented. Additionally, it is shown that a TAN calibration is also possible in case of unequal reflections of the Network.

Summary
A simple evaluation procedure of the TAN calibration and the influence of non-ideal calibration elements on VNA S-parameter measurements

Excerpt
Engen, G. F. and Hoer, C. A.: Thru-Reflect-Line: An Improved Technique for Calibrating the Dual Six-port Automatic Network Analyzer, IEEE Trans. Microwave Theory Tech., 27, 987–993, 1979.; Eul, H.-J. and Schiek, B.: A Generalized Theory and New Calibration Procedures for Network Analyzer Self-Calibration, IEEE Trans. Microwave Theory Tech., 39, 724–731, 1991.; Gronau, G.: Höchstfrequenztechnik. Berlin, Springer, Ch. 8, 389–398, 2001.; Rytting, D.: Network Analyzer Error Models and Calibration Methods, ARFTG/NIST Short Course on RF Measurements for a Wireless World, San Diego, CA, Nov. 29–30, 2001.; Schiek, B.: Grundlagen der Hochfrequenz-Messtechnik. Berlin, Springer, Ch. 4.4, p. 159, 1999.; Stumper, U.: Influence of TMSO Calibration Standards Uncertainties on VNA S-Parameter Measurements, IEEE Trans. Instrum. Meas., 52, 311-315, 2003a.; Stumper, U.: Uncertainty of VNA S-Parameter Measurement due to Non-Ideal TMSO or LMSO Calibration Standards, Advances in Radio Science (Kleinheubacher Berichte), [Online], 1, 1–8, available: http://www.copernicus.org/URSI/ars/1/1.pdf, 2003b.; Stumper, U.: Uncertainty of VNA S-Parameter Measurement due to Non-Ideal TRL Calibration Items, IEEE Trans. Instrum. Meas., 55, 676–679, 2005a.; Stumper, U.: Fehlerfortpflanzung bei der LRL- oder TRL-Kalibrierung eines vektoriellen Vierstellen-Netzwerkanalysators, in: Neue Kalibrierverfahren im Nieder- und Hochfrequenzbereich – Vorträge des 206. PTB-Seminars, edited by: Bachmair, H., PTB-Bericht E-89, Braunschweig, May 2005b.; Stumper, U.: Influence of Non-ideal LRL or TRL Calibration Elements on VNA S-Parameter Measurements, Advances in Radio Science (Kleinheubacher Berichte), [Online], 3, 51–58, available: http://www.copernicus.org/URSI/ars/3/ars-3-51.pdf, 2005c.

 

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